Current Issue Slideshow
ZEISS today introduced the Advanced Reconstruction Toolbox for its industry-leading Xradia Versa series of non-destructive 3D X-ray microscopes (XRM) and its Xradia Context 3D X-ray micro-computed tomography (microCT) systems. Leveraging in-house algorithms and proprietary workflows in combination with a high-performance workstation, the Advanced Reconstruction Toolbox dramatically improves the throughput and image quality of 3D image reconstruction – an essential step in 3D XRM for failure analysis (FA). The result is faster time to results, improved FA success rates and even new applications and workflows for semiconductor advanced packaging.
The Advanced Reconstruction Toolbox comprises a workstation and two module offerings – ZEISS OptiRecon for iterative reconstruction, and ZEISS DeepRecon, the first commercially available deep learning reconstruction technology for microscopy applications.